Microelectronic Yield, Reliability, and Advanced Packaging

Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV

In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing

In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II

Microelectronics Manufacturing and Reliability

Microelectronics: Design, Technology, and Packaging

Microelectronic Packaging and Laser Processing

In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing

Design, Characterization, and Packaging for MEMS and Microelectronics

Microelectronics: Design, Technology, and Packaging II

Microelectronics: Design, Technology, and Packaging III

In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II

High Yield Report

Design, Characterization, and Packaging for MEMS and Microelectronics II

Microelectronic Interconnects and Packages: Optical and Electrical Technologies

Microelectronic Interconnects and Packages: System and Process Integration

Advanced Packaging

Advanced Packaging

Advanced Packaging

Advanced Microelectronic Processing Techniques

Advances in Microelectronic Device Technology

Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI

Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII

Testing, Packaging, Reliability, and Applications of Semiconductor Lasers IV

Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV

Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V

Inside the yield book : tools for bond market strategy /
por: Homer Sidney, et al.

Inside the yield book : tools for bond market strategy /
por: Homer Sidney, et al.

Inside the yield book : new tools for bond market strategy /
por: Homer Sidney Author

Inside the yield book : new tools for bond market strategy /
por: Homer Sidney Author

Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI

Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII

Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X

Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX

Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII

Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies

International Conference of Microelectronics: Microelectronics '92