Wang, S. Testing, Reliability, and Applications of Optoelectronic Devices. SPIE Digital Library.
Style de citation Chicago (17e éd.)Wang, Shing-Chung. Testing, Reliability, and Applications of Optoelectronic Devices. SPIE Digital Library.
Style de citation MLA (9e éd.)Wang, Shing-Chung. Testing, Reliability, and Applications of Optoelectronic Devices. SPIE Digital Library.
Attention : ces citations peuvent ne pas être correctes à 100%.