Wang, S. Testing, Reliability, and Applications of Optoelectronic Devices. SPIE Digital Library.
Citación estilo ChicagoWang, Shing-Chung. Testing, Reliability, and Applications of Optoelectronic Devices. SPIE Digital Library.
Cita MLAWang, Shing-Chung. Testing, Reliability, and Applications of Optoelectronic Devices. SPIE Digital Library.
Warning: These citations may not always be 100% accurate.