APA (7th ed.) Zitazioa

Kissinger, G. In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II. SPIE Digital Library.

Chicago Style (17th ed.) Zitazioa

Kissinger, Gudrun. In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II. SPIE Digital Library.

MLA (9th ed.) Zitazioa

Kissinger, Gudrun. In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II. SPIE Digital Library.

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