Kissinger, G. In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II. SPIE Digital Library.
Citazione stile Chigago Style (17a edizione)Kissinger, Gudrun. In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II. SPIE Digital Library.
Citatione MLA (9a ed.)Kissinger, Gudrun. In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II. SPIE Digital Library.
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