Kissinger, G. In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II. SPIE Digital Library.
Citação do estilo Chicago (17ª ed.)Kissinger, Gudrun. In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II. SPIE Digital Library.
Citação MLA (9ª ed.)Kissinger, Gudrun. In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II. SPIE Digital Library.
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