APA引文

Kissinger, G. In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II. SPIE Digital Library.

Chicago Style (17th ed.) Citation

Kissinger, Gudrun. In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II. SPIE Digital Library.

MLA引文

Kissinger, Gudrun. In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II. SPIE Digital Library.

警告：這些引文格式不一定是100％准確.