In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II
| Beste egile batzuk: | |
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| Formatua: | Baliabide elektronikoa eBook |
| Hizkuntza: | ingelesa |
| Argitaratua: |
SPIE Digital Library,
4/23/01
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| Gaiak: | |
| Sarrera elektronikoa: | Full text available on Research4Life (SPIE Digital Library) |
| Alearen deskribapena: | <strong>On-Campus Access Only (IP based access)</strong> |
|---|---|
| Deskribapen fisikoa: | 1 online resource |
| Formatua: | Mode of access: Internet |
| ISBN: | 9780819441072 |
| Sartu: | Electronic access restricted to authorized AUW faculty, staff and students |