In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II
| Andere auteurs: | |
|---|---|
| Formaat: | Elektronisch E-boek |
| Taal: | Engels |
| Gepubliceerd in: |
SPIE Digital Library,
4/23/01
|
| Onderwerpen: | |
| Online toegang: | Full text available on Research4Life (SPIE Digital Library) |
| Beschrijving item: | <strong>On-Campus Access Only (IP based access)</strong> |
|---|---|
| Fysieke beschrijving: | 1 online resource |
| Formaat: | Mode of access: Internet |
| ISBN: | 9780819441072 |
| Toegang: | Electronic access restricted to authorized AUW faculty, staff and students |