Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries II

Xehetasun bibliografikoak
Beste egile batzuk: Duparré, Angela
Formatua: Baliabide elektronikoa eBook
Hizkuntza:ingelesa
Argitaratua: SPIE Digital Library, 12/10/01
Gaiak:
Sarrera elektronikoa:Full text available on Research4Life (SPIE Digital Library)
Deskribapena
Alearen deskribapena:<strong>On-Campus Access Only (IP based access)</strong>
Deskribapen fisikoa:1 online resource
Formatua:Mode of access: Internet
ISBN:9780819441638
Sartu:Electronic access restricted to authorized AUW faculty, staff and students