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Reliability, Testing, and Characterization of MEMS/MOEMS

Dades bibliogràfiques
Altres autors:	Ramesham, Rajeshuni
Format:	Electrònic eBook
Idioma:	anglès
Publicat:	SPIE Digital Library, 10/2/01
Matèries:	Conference papers and proceedings.
Accés en línia:	Full text available on Research4Life (SPIE Digital Library)

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