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Reliability, Testing, and Characterization of MEMS/MOEMS

Dettagli Bibliografici
Altri autori:	Ramesham, Rajeshuni
Natura:	Elettronico eBook
Lingua:	inglese
Pubblicazione:	SPIE Digital Library, 10/2/01
Soggetti:	Conference papers and proceedings.
Accesso online:	Full text available on Research4Life (SPIE Digital Library)

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