Duparré, A. Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components. SPIE Digital Library.
Citação norma ChicagoDuparré, Angela. Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components. SPIE Digital Library.
Citação norma MLADuparré, Angela. Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components. SPIE Digital Library.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.