Surface Scattering and Diffraction for Advanced Metrology II

Bibliografiska uppgifter
Övriga skapare: Gu, Zu-Han
Materialtyp: Elektronisk E-bok
Språk:engelska
Publicerad: SPIE Digital Library, 10/22/02
Ämnen:
Länkar:Full text available on Research4Life (SPIE Digital Library)
Beskrivning
Beskrivning:<strong>On-Campus Access Only (IP based access)</strong>
Fysisk beskrivning:1 online resource
Materialtyp:Mode of access: Internet
ISBN:9780819445476
Tillgång:Electronic access restricted to authorized AUW faculty, staff and students