Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life

Bibliografski detalji
Daljnji autori: Chugui, Yuri
Format: Elektronički e-knjiga
Jezik:engleski
Izdano: SPIE Digital Library, 7/29/02
Teme:
Online pristup:Full text available on Research4Life (SPIE Digital Library)