Ramesham, R. Reliability, Testing, and Characterization of MEMS/MOEMS II. SPIE Digital Library.
Chicago Style (17th ed.) CitationRamesham, Rajeshuni. Reliability, Testing, and Characterization of MEMS/MOEMS II. SPIE Digital Library.
ציטוט MLARamesham, Rajeshuni. Reliability, Testing, and Characterization of MEMS/MOEMS II. SPIE Digital Library.
אזהרה: ציטוטים אלה לעיתים לא מדויקים ב 100%.