Reliability, Testing, and Characterization of MEMS/MOEMS II

Bibliographic Details
Other Authors: Ramesham, Rajeshuni
Format: Electronic eBook
Language:English
Published: SPIE Digital Library, 1/16/03
Subjects:
Online Access:Full text available on Research4Life (SPIE Digital Library)
Description
Item Description:<strong>On-Campus Access Only (IP based access)</strong>
Physical Description:1 online resource
Format:Mode of access: Internet
ISBN:9780819447807
Access:Electronic access restricted to authorized AUW faculty, staff and students