Reliability, Testing, and Characterization of MEMS/MOEMS II

Ngā taipitopito rārangi puna kōrero
Ētahi atu kaituhi: Ramesham, Rajeshuni
Hōputu: Tāhiko īPukapuka
Reo:Ingarihi
I whakaputaina: SPIE Digital Library, 1/16/03
Ngā marau:
Urunga tuihono:Full text available on Research4Life (SPIE Digital Library)
Whakaahuatanga
Whakaahutanga tūemi:<strong>On-Campus Access Only (IP based access)</strong>
Whakaahuatanga ōkiko:1 online resource
Hōputu:Mode of access: Internet
ISBN:9780819447807
Urunga:Electronic access restricted to authorized AUW faculty, staff and students