Obálka

Reliability, Testing, and Characterization of MEMS/MOEMS II

Podrobná bibliografie
Další autoři:	Ramesham, Rajeshuni
Médium:	Elektronický zdroj E-kniha
Jazyk:	angličtina
Vydáno:	SPIE Digital Library, 1/16/03
Témata:	Conference papers and proceedings.
On-line přístup:	Full text available on Research4Life (SPIE Digital Library)

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