Нүүр зураг

Reliability, Testing, and Characterization of MEMS/MOEMS II

Номзүйн дэлгэрэнгүй
Бусад зохиолчид:	Ramesham, Rajeshuni
Формат:	Цахим Цахим ном
Хэл сонгох:	англи
Хэвлэсэн:	SPIE Digital Library, 1/16/03
Нөхцлүүд:	Conference papers and proceedings.
Онлайн хандалт:	Full text available on Research4Life (SPIE Digital Library)

Ижил төстэй зүйлс

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Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII

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Novel Patterning Technologies for Semiconductors, MEMS/NEMS, and MOEMS 2019