Herr, D. Metrology, Inspection, and Process Control for Microlithography XVII. SPIE Digital Library.
Chicago Style (17. basım) AtıfHerr, Daniel. Metrology, Inspection, and Process Control for Microlithography XVII. SPIE Digital Library.
MLA (9th ed.) AtıfHerr, Daniel. Metrology, Inspection, and Process Control for Microlithography XVII. SPIE Digital Library.
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