Tobin, K. Process and Materials Characterization and Diagnostics in IC Manufacturing. SPIE Digital Library.
Chicago Style (17th ed.) CitationTobin, Kenneth. Process and Materials Characterization and Diagnostics in IC Manufacturing. SPIE Digital Library.
MLA (9th ed.) CitationTobin, Kenneth. Process and Materials Characterization and Diagnostics in IC Manufacturing. SPIE Digital Library.
Advarsel: Disse citationer er muligvist ikke 100% nøjagtige.