Tobin, K. Process and Materials Characterization and Diagnostics in IC Manufacturing. SPIE Digital Library.
Chicago-viite (17. p.)Tobin, Kenneth. Process and Materials Characterization and Diagnostics in IC Manufacturing. SPIE Digital Library.
MLA-viite (9. p.)Tobin, Kenneth. Process and Materials Characterization and Diagnostics in IC Manufacturing. SPIE Digital Library.
Varoitus: Nämä viitteet eivät aina ole täysin luotettavia.