Tobin, K. Process and Materials Characterization and Diagnostics in IC Manufacturing. SPIE Digital Library.
Lua i Stíl Chicago (17ú heag.)Tobin, Kenneth. Process and Materials Characterization and Diagnostics in IC Manufacturing. SPIE Digital Library.
Lua MLA (9ú heag.)Tobin, Kenneth. Process and Materials Characterization and Diagnostics in IC Manufacturing. SPIE Digital Library.
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