Cita APA

Tobin, K. Process and Materials Characterization and Diagnostics in IC Manufacturing. SPIE Digital Library.

Citación estilo Chicago

Tobin, Kenneth. Process and Materials Characterization and Diagnostics in IC Manufacturing. SPIE Digital Library.

Cita MLA

Tobin, Kenneth. Process and Materials Characterization and Diagnostics in IC Manufacturing. SPIE Digital Library.

Warning: These citations may not always be 100% accurate.