Tobin, K. Process and Materials Characterization and Diagnostics in IC Manufacturing. SPIE Digital Library.
Citazione stile Chigago Style (17a edizione)Tobin, Kenneth. Process and Materials Characterization and Diagnostics in IC Manufacturing. SPIE Digital Library.
Citatione MLA (9a ed.)Tobin, Kenneth. Process and Materials Characterization and Diagnostics in IC Manufacturing. SPIE Digital Library.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.