Gorecki, C. Microsystems Engineering: Metrology and Inspection III. SPIE Digital Library.
Citación estilo ChicagoGorecki, Christophe. Microsystems Engineering: Metrology and Inspection III. SPIE Digital Library.
Cita MLAGorecki, Christophe. Microsystems Engineering: Metrology and Inspection III. SPIE Digital Library.
Warning: These citations may not always be 100% accurate.