Duparré, A. Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies. SPIE Digital Library.
Citação norma ChicagoDuparré, Angela. Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies. SPIE Digital Library.
Citação norma MLADuparré, Angela. Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies. SPIE Digital Library.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.