Citace podle APA (7th ed.)

Tanner, D. Reliability, Testing, and Characterization of MEMS/MOEMS III. SPIE Digital Library.

Citace podle Chicago (17th ed.)

Tanner, Danelle. Reliability, Testing, and Characterization of MEMS/MOEMS III. SPIE Digital Library.

Citace podle MLA (9th ed.)

Tanner, Danelle. Reliability, Testing, and Characterization of MEMS/MOEMS III. SPIE Digital Library.

Upozornění: Tyto citace jsou generovány automaticky. Nemusí být zcela správně podle citačních pravidel..