Style de citation APA (7e éd.)

Tanner, D. Reliability, Testing, and Characterization of MEMS/MOEMS III. SPIE Digital Library.

Style de citation Chicago (17e éd.)

Tanner, Danelle. Reliability, Testing, and Characterization of MEMS/MOEMS III. SPIE Digital Library.

Style de citation MLA (9e éd.)

Tanner, Danelle. Reliability, Testing, and Characterization of MEMS/MOEMS III. SPIE Digital Library.

Attention : ces citations peuvent ne pas être correctes à 100%.