Tanner, D. Reliability, Testing, and Characterization of MEMS/MOEMS III. SPIE Digital Library.
Čikaški stil citiranja (17. izdanje)Tanner, Danelle. Reliability, Testing, and Characterization of MEMS/MOEMS III. SPIE Digital Library.
MLA način citiranja (9. izdanje)Tanner, Danelle. Reliability, Testing, and Characterization of MEMS/MOEMS III. SPIE Digital Library.
Upozorenje: Ovi citati možda nisu uvijek 100% točni.