Tanner, D. Reliability, Testing, and Characterization of MEMS/MOEMS III. SPIE Digital Library.
Chicago-čujuhus (17. p.)Tanner, Danelle. Reliability, Testing, and Characterization of MEMS/MOEMS III. SPIE Digital Library.
MLA-čujuhus (9. p.)Tanner, Danelle. Reliability, Testing, and Characterization of MEMS/MOEMS III. SPIE Digital Library.
Muitte dárkkistit čujuhemiid riektatvuođa, ovdal go geavahat daid iežat deavsttas.