APA (7. basım) Alıntı

Tanner, D. Reliability, Testing, and Characterization of MEMS/MOEMS III. SPIE Digital Library.

Chicago Style (17. basım) Atıf

Tanner, Danelle. Reliability, Testing, and Characterization of MEMS/MOEMS III. SPIE Digital Library.

MLA (9th ed.) Atıf

Tanner, Danelle. Reliability, Testing, and Characterization of MEMS/MOEMS III. SPIE Digital Library.

Uyarı: Bu alıntı herzaman %100 doğru olmayabilir..