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Reliability, Testing, and Characterization of MEMS/MOEMS III

Detalhes bibliográficos
Outros Autores:	Tanner, Danelle
Formato:	Recurso Electrónico livro electrónico
Idioma:	inglês
Publicado em:	SPIE Digital Library, 12/23/03
Assuntos:	Conference papers and proceedings.
Acesso em linha:	Full text available on Research4Life (SPIE Digital Library)

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