APA ציטוט

Tanner, D. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV. SPIE Digital Library.

Chicago Style (17th ed.) Citation

Tanner, Danelle. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV. SPIE Digital Library.

ציטוט MLA

Tanner, Danelle. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV. SPIE Digital Library.