APA(7版)引用形式

Tanner, D. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV. SPIE Digital Library.

Chicagoスタイル(17版)引用形式

Tanner, Danelle. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV. SPIE Digital Library.

MLA(9版)引用形式

Tanner, Danelle. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV. SPIE Digital Library.

警告: この引用は必ずしも正確ではありません.