Tanner, D. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV. SPIE Digital Library.
Chicago (17e ed.) BronvermeldingTanner, Danelle. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV. SPIE Digital Library.
MLA (9e ed.) BronvermeldingTanner, Danelle. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV. SPIE Digital Library.
Let op: Deze citaties zijn niet altijd 100% accuraat.