Tanner, D. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV. SPIE Digital Library.
Chicago-čujuhus (17. p.)Tanner, Danelle. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV. SPIE Digital Library.
MLA-čujuhus (9. p.)Tanner, Danelle. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV. SPIE Digital Library.
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