APA (7. basım) Alıntı

Tanner, D. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV. SPIE Digital Library.

Chicago Style (17. basım) Atıf

Tanner, Danelle. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV. SPIE Digital Library.

MLA (9th ed.) Atıf

Tanner, Danelle. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV. SPIE Digital Library.

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