Geer, R. Testing, Reliability, and Application of Micro- and Nano-Material Systems III. SPIE Digital Library.
Chicago-viite (17. p.)Geer, Robert. Testing, Reliability, and Application of Micro- and Nano-Material Systems III. SPIE Digital Library.
MLA-viite (9. p.)Geer, Robert. Testing, Reliability, and Application of Micro- and Nano-Material Systems III. SPIE Digital Library.
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