Geer, R. Testing, Reliability, and Application of Micro- and Nano-Material Systems III. SPIE Digital Library.
Цитирование в стиле Чикаго (17-е изд.)Geer, Robert. Testing, Reliability, and Application of Micro- and Nano-Material Systems III. SPIE Digital Library.
Цитирование MLA (9-е изд.)Geer, Robert. Testing, Reliability, and Application of Micro- and Nano-Material Systems III. SPIE Digital Library.
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