Testing, Reliability, and Application of Micro- and Nano-Material Systems III

Bibliografiske detaljer
Andre forfattere: Geer, Robert
Format: Electronisk eBog
Sprog:engelsk
Udgivet: SPIE Digital Library, 5/9/05
Fag:
Online adgang:Full text available on Research4Life (SPIE Digital Library)
Beskrivelse
Emne beskrivelse:<strong>On-Campus Access Only (IP based access)</strong>
Fysisk beskrivelse:1 online resource
Format:Mode of access: Internet
ISBN:9780819457479
Adgang:Electronic access restricted to authorized AUW faculty, staff and students