Testing, Reliability, and Application of Micro- and Nano-Material Systems III

Xehetasun bibliografikoak
Beste egile batzuk: Geer, Robert
Formatua: Baliabide elektronikoa eBook
Hizkuntza:ingelesa
Argitaratua: SPIE Digital Library, 5/9/05
Gaiak:
Sarrera elektronikoa:Full text available on Research4Life (SPIE Digital Library)
Deskribapena
Alearen deskribapena:<strong>On-Campus Access Only (IP based access)</strong>
Deskribapen fisikoa:1 online resource
Formatua:Mode of access: Internet
ISBN:9780819457479
Sartu:Electronic access restricted to authorized AUW faculty, staff and students