Testing, Reliability, and Application of Micro- and Nano-Material Systems III

Bibliografske podrobnosti
Drugi avtorji: Geer, Robert
Format: Elektronski eKnjiga
Jezik:angleščina
Izdano: SPIE Digital Library, 5/9/05
Teme:
Online dostop:Full text available on Research4Life (SPIE Digital Library)
Opis
Opis knjige/članka:<strong>On-Campus Access Only (IP based access)</strong>
Fizični opis:1 online resource
Format:Mode of access: Internet
ISBN:9780819457479
Dostop:Electronic access restricted to authorized AUW faculty, staff and students