Testing, Reliability, and Application of Micro- and Nano-Material Systems III

書目詳細資料
其他作者: Geer, Robert
格式: 電子 電子書
語言:英语
出版: SPIE Digital Library, 5/9/05
主題:
在線閱讀:Full text available on Research4Life (SPIE Digital Library)
實物特徵
Item Description:<strong>On-Campus Access Only (IP based access)</strong>
實物描述:1 online resource
格式:Mode of access: Internet
ISBN:9780819457479
訪問:Electronic access restricted to authorized AUW faculty, staff and students