Testing, Reliability, and Application of Micro- and Nano-Material Systems III

Manylion Llyfryddiaeth
Awduron Eraill: Geer, Robert
Fformat: Electronig eLyfr
Iaith:Saesneg
Cyhoeddwyd: SPIE Digital Library, 5/9/05
Pynciau:
Mynediad Ar-lein:Full text available on Research4Life (SPIE Digital Library)

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