Duparré, A. Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II. SPIE Digital Library.
Cita Chicago (17th ed.)Duparré, Angela. Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II. SPIE Digital Library.
Cita MLA (9th ed.)Duparré, Angela. Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II. SPIE Digital Library.
Atenció: Aquestes cites poden no estar 100% correctes.