Tanner, D. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V. SPIE Digital Library.
शिकागो शैली (17वां संस्करण) प्रशस्ति पत्रTanner, Danelle. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V. SPIE Digital Library.
एमएलए (9वां संस्करण) प्रशस्ति पत्रTanner, Danelle. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V. SPIE Digital Library.
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