Testing, Reliability, and Application of Micro- and Nano-Material Systems IV

Détails bibliographiques
Autres auteurs: Geer, Robert
Format: Électronique eBook
Langue:anglais
Publié: SPIE Digital Library, 3/16/06
Sujets:
Accès en ligne:Full text available on Research4Life (SPIE Digital Library)
Description
Description:<strong>On-Campus Access Only (IP based access)</strong>
Description matérielle:1 online resource
Format:Mode of access: Internet
ISBN:9780819462282
Accès:Electronic access restricted to authorized AUW faculty, staff and students