APA ציטוט

Hartzell, A. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI. SPIE Digital Library.

Chicago Style (17th ed.) Citation

Hartzell, Allyson. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI. SPIE Digital Library.

ציטוט MLA

Hartzell, Allyson. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI. SPIE Digital Library.